A New Analog-to-Digital Converter BIST Considering a Transient Zone
In‐Soo Kim, Ki-Sun Kim, Young-Ho Kim, H. SON, Seokhyeong Kang · IEICE Transactions on Electronics · 2007
A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.