Online Test Technology for Reversible Circuits
Jing Hu, Dian Zhong Wen · Applied Mechanics and Materials · 2012
A new technique is presented for online test with some garbage lines in reversible circuits. Firstly, testable structures for reversible logic are given. Then, a scan-D Flip-Flops for constructing scan-chains is provided. Using the new scan-D Flip-Flops, test programs for reversible circuits were analyzed. The proposed method was tested on a set of reversible benchmarks. It realized online test.