Fast nearest neighbour testing algorithm for small feature sizes
Olcay Taner Yıldız, Lale Akarun, H. Levent Akın · Electronics Letters · 2004
A fast nearest neighbour algorithm with a logarithmic expected testing time for small feature sizes is presented. It has been tested on a Robot Vision application for YUV space. The algorithm time requirement is better than a multilayer perceptron trained for the same purpose.