Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction
Wang‐Dauh Tseng, Lung‐Jen Lee, R.-B. Lin · IET Computers & Digital Techniques · 2010
Large test data volume and excessive test power are two strict challenges for very large-scale integration testing. This study presents a deterministic built-in self-test scheme using variable-length multiple linear feedback shift registers to generate the compressed low power test set. The experimental results show that both test power and test application time can be reduced significantly.