Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability
Galiay, Crouzet, Vergniault · IEEE Transactions on Computers · 1980
At the end of an IC production line, integrated circuits are generally submitted to three kinds of tests: 1) parametric tests to check electrical characteristics (voltage, current, power consumption), 2) dynamic tests to check response times under nominal operating conditions, and 3) functional tests to check its logical behavior.