A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Y. Zorian · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2012
In this paper, all linked and unlinked static and two-operation dynamic faults are considered. A classification for their description is introduced. To generate a test algorithm for detection of all the considered faults, it was shown that it is not an easy problem. For this purpose, a new structure-oriented method is developed. Based on the proposed method, an efficient test algorithm March LSD of complexity 75N is generated for the detection of the considered linked static and dynamic faults.