Spatially adaptive denoising using mixture modeling of wavelet coefficients
Il Kyu Eom, Yoo-shin Kim · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003
A wavelet coefficient is generally classified into two categories: significant (large) and insignificant (small). Therefore, each wavelet coefficient is efficiently modelled as a random variable of a Gaussian mixture distribution with unknown parameters. In this paper, we propose an image denoising method by using mixture modelling of wavelet coefficients. The coefficient is classified as either noisy or clean by using proper threshold [2]. Based on this classification, binary mask value that takes an important role to suppress noise is produced. The probability of being clean signal is estimated by a set of mask values. Then we apply this probability to design Wiener filter to reduce noise and also develop the method of selecting windows of different sizes around the coefficient. Despite the simplicity of our method, experimental results show that our method outperforms other critically sampled wavelet denoising schemes.