Restoration of high-resolution AFM images captured with broken probes
Y. F. Wang, David Corrigan, Christopher J. Forman, Suzanne Jarvis, Anil C. Kokaram · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012
A type of artefact is induced by damage of the scanning probe when the Atomic Force Microscope (AFM) captures a material surface structure with nanoscale resolution. This artefact has a dramatic form of distortion rather than the traditional blurring artefacts. Practically, it is not easy to prevent the damage of the scanning probe. However, by using natural image deblurring techniques in image processing domain, a comparatively reliable estimation of the real sample surface structure can be generated. This paper introduces a novel Hough Transform technique as well as a Bayesian deblurring algorithm to remove this type of artefact. The deblurring result is successful at removing blur artefacts in the AFM artefact images. And the details of the fibril surface topography are well preserved.