RF device forensics using passband filter analysis
Deen King-Smith, Aravind K. Mikkilineni, Saul B. Gelfand, Edward J. Delp · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009
Given the wide use of Radio Frequency (RF) devices for applications ranging from data networks to wireless sensors, it is of interest to be able to characterize individual devices to verify compliance with FCC Part 15 rules. In an effort to characterize these types of devices we have developed a system that utilizes specially designed probe signals to elicit a response from the device from which unique characteristics can be extracted. The features that uniquely characterize a device are referred to as device signatures or device fingerprints. We apply this approach to RF devices which employ different bandpass filters, and construct training based classifiers which are highly accurate. We also introduce a model-based framework for optimal detection that can be employed to obtain performance limits, and to study model mismatch and probe optimization.