Application of Fast Biorthogonal Spline Wavelet Transform in Automatic Inspection
Huiqin Jiang, Jianming Lu, Takashi Yahagi · IEEJ Transactions on Electronics Information and Systems · 2004
In the development of an automatic inspection device for inspecting the quality of printed circuit boards, it is necessary to be able to detect precisely and quickly the position of the demarcation line between two very close components on a printed circuit board. In this study, first this problem is changed to the problem of singularity detection in signals. Second, a new algorithm based on a fast biorthogonal spline wavelet transform (FBSWT) is proposed. According to the experimental results presented, the efficiency of the proposed algorithm is demonstrated.