Efficient and Accurate Testing of On-Chip ADC Based on ATE
Shu Hua Wei, Lan Dai, Xiao Bo Zhang, Yan Jiang · Applied Mechanics and Materials · 2013
The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested based on the Credence Gemini500 verification system. The testing method is studied and verified through the test experiment and results. This testing method is an important reference for general embedded IP core testing.