Resistance characterization for weak open defects
Rosa Rodriguez-Montanes, José Pineda de Gyvez, Paul A. J. Volf · IEEE Design & Test of Computers · 2002
Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests.