Quantum ellipsometry using correlated-photon beams
Kimani C. Toussaint, Giovanni Di Giuseppe, Kenneth J. Bycenski, Alexander V. Sergienko, Bahaa E. A. Saleh, Malvin Carl Teich · Physical Review A · 2004
We report ellipsometric measurements made on semiconductor samples using photon-correlated beams produced by the process of spontaneous parametric down-conversion. Such a source yields higher accuracy than its quantum-limited conventional counterpart. We also show that our approach has the added advantage of not requiring an external reference sample for calibration.