Analysis of triple dwell-time acquisition scheme for frequency-hopped spread spectrum signals
WASEEM W. S. JIBRAlL, Sami M. Al-Salman · International Journal of Electronics · 1995
A serial-search frequency-hopped acquisition scheme that employs a triple dwell-time with binary integration (TDT/BI) is analysed. The probability density function, characteristic function and mean value of the random acquisition time for this scheme are obtained. Moreover, the performance of the TDT/BI acquisition scheme is established in partial-band noise jamming and partial-band tone jamming in addition to additive white gaussian noise environments. Results indicate that the TDT/BI acquisition scheme outperforms the double dwell-time with binary integration (DDT/BI) acquisition scheme at relatively high jamming-to-signal ratios (JSR). Thus, in the presence of tone jamming, the TDT/BI acquisition scheme features a mean acquisition time that is 0·2 times faster than that of the DDT/BI scheme at JSR= 12dB; while in the presence of noise jamming the TDT/BI acquisition scheme is about 0·6 times faster than the DDT/BI scheme at the same JSR.