An Abstract Fault Model for NAND Flash Memory
Ji Hyuck Yun, Jin Hyuk Yoon, Eyee Hyun Nam, Sang Lyul Min · IEEE Embedded Systems Letters · 2012
We present an abstract fault model for NAND flash memory that describes precisely the effects of various faults during a flash operation. The abstract model is intended to be used to reason about fault-related correctness of key modules of flash memory management software such as a flash translation layer (FTL). We also introduce the concept of “SAO-compliance” to raise awareness about fault-related vulnerabilities of current flash memory management software and to promote much needed research to fix them.