DC built-in self-test for linear analog circuits
Abhijit Chatterjee, B.C. Kim, Naveena Nagi · IEEE Design & Test of Computers · 1996
DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuit's DC transfer function.