Geometric phase in quantum eraser and weak measurement
Shuhei Tamate, H. Kobayashi, Toshihiro Nakanishi, Kazuhiko Sugiyama, Masao Kitano, Timothy C. Ralph, Ping Koy Lam · AIP conference proceedings · 2011
We investigate the mechanism of weak measurement by using an interferometric framework. In order to appropriately elucidate the interference effect that occurs in weak measurement, we introduce an interferometer for particles with internal degrees of freedom. We demonstrate that the geometric phase, particularly the Pancharatnam phase, results from the post‐selection of the internal state, and thereby the interference pattern is changed. It is revealed that the extraordinary displacement of the probe wavepackets in weak measurement is achieved by utilizing the Pancharatnam phase.