Discarding wide baseline mismatches with global and local transformation consistency
H.B. Zhou, D. Z. Zhang, C. Chen, Jingduo Tian · Electronics Letters · 2011
A novel method called global and local transformation consistency constraints, which combines the scale, orientation and spatial layout information of ‘scale invariant feature transform’ (SIFT) features, is proposed for discarding mismatches from given putative point correspondences. Experiments show that the proposed method can efficiently extract high-precision matches from low-precision putative SIFT matches for wide baseline image pairs, and outperforms or performs close to state-of-the-art approaches.