Cost-effective deterministic partitioning for rapid diagnosis in scan-based BIST
I. Bayraktaroglu, Alex Orailoğlu · IEEE Design & Test of Computers · 2002
Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.