A low-cost input vector monitoring concurrent BIST scheme
Ioannis Voyiatzis, Constantinos E. Efstathiou, Cleo Sgouropoulou · 2013
Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.