Fractal recognition of compact artifacts on color images
Artem V. Nikonorov, E. Yu. Minaev · Pattern Recognition and Image Analysis · 2013
Analysis of small test fragments or compact artifacts is essential for many color correction problems. An efficient method of analysis is the recognition of compact artifacts. However, pattern recognition by features requires the determination of significant features for each applied problem. An alternative approach to the recognition of compact artifacts, which requires no feature extraction and is based on systems of iterated functions and comparison of their attractors, is proposed.