Evaluation of active appearance models in varying background conditions
Marek Kowalski, Jacek Naruniec · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013
In this paper we present an evaluation of the chosen versions of Active Appearance Models (AAM) in varying background conditions. Algorithms were tested on a subset of the CMU PIE database and chosen background im- ages. Our experiments prove, that the accuracy of those methods is strictly correlated with the used background, where the differences in the success rate differ even up to 50%.