Estimation of statistical variables for analogue fault detectability evaluation
Dimitris K. Papakostas, Alkis A. Hatzopoulos · IEE Proceedings - Circuits Devices and Systems · 1999
An efficient method for estimating the mean value and standard deviation of output measurements is introduced. It takes into account statistical variations of component values and gives accurate and realistic results with less computational time compared with the Monte Carlo technique. A method for the estimation of fault detectability of output measurements in a simulation-before-test approach is proposed. Results from four different circuits show the effectiveness of the methods in selecting the measurement with the highest detectability among a given set and also their application for input stimulus selection.