Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices
Kazuya Katsuki, Manabu Kotani, Kazutoshi Kobayashi, Hidetoshi Onodera · 2006
Abstract — It is possible to enhance speed and yield of reconfigurable devices utilizing WID variations. An LUT array LSI is fabricated on a 90nm process to mea-sure WID and D2D variations. Performance fluctua-tions are measured by counting the number of LUTs through which a signal is passing within a certain time. D2D and WID variations are clearly observed by the measurement. I.