Optimal thresholds for multiwavelet shrinkage
Tai-Chiu Hsung, Daniel Pak-Kong Lun · Electronics Letters · 2003
Optimal thresholds selection for multiwavelet denoising using multivariate shrinkage is considered. Unlike other risk estimators which are derived for a single threshold, a new risk estimator is proposed for each decomposition level based on the principle of Stein's unbiased risk estimator.