Expert system for performing measurement system characterization
Robert R. Hershey, Terrence E. Zavecz · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1992
The considerations which drive an expert system for assisting in measurement system characterization are described. The expert system employs several novel techniques for evaluating the integrity of a characterization analysis by determining the degree to which critical assumptions are satisfied and flagging weak points in the data collection or analysis procedure. The properties of good characterization sampling plans are derived. Methods for formulating reliable characterization studies are described. The paper focuses on short term studies intended for equipment comparisons and calibrations; however, with minor alterations it can be expanded to include longer term stability studies.