Test-point selection and testability measures via QR factorization of linear models
Gerard N. Stenbakken, Tina M. Souders · IEEE Transactions on Instrumentation and Measurement · 1987
An efficient algorithm is presented for selecting test points for use in applications such as calibration and fault diagnosis of electronic networks. The algorithm, based on QR factorization of the circuit sensitivity matrix, minimizes the prediction or estimation errors which result from random measurement error. A definition of testability based on the concept of minimum estimation error is also introduced. Practical examples are given.