Scan-Based Tests with Low Switching Activity
Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski · IEEE Design & Test of Computers · 2007
Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation because of increased switching activity caused by the tests. In this paper, we propose a method that fills unspecified entries in test cubes to reduce the switching activity caused by scan tests simultaneously during the scan-shift and capture cycles. Our method doesn't require additional hardware or modifications to the scan chains.