A low power testing architecture for test-per-clock BIST
Sun Haijun, Wang Xuanming, Shaochong Lei, Shao Zhibiao · 2012
A novel allocated-by-weight seed-based BIST (ASB) architecture has been proposed for combinational circuits to test. A test sequence of ASB is termed as seeded weighted Gray cyclic shift sequence (SW-GCSS), generated by Gray cyclic shift sequence (GCSS) and canonical seeds. GCSS, termed as the characteristic sequence is a single input change (SIC) sequence with transitions of its bits different from each other. Based on theoretical deduction of the properties of canonical seeds, a novel algebraic model and an optimized algorithm have been developed, based on which a seed circuit is provided. SW-GCSS whose vectors are unique should be assigned to CUT (Circuit Under Test) according to weights to improve test efficiency. A method used to calculate and adjust weights is also given. Experimental results on the ISCAS85 benchmark circuits show that ASB architecture can achieve a 59.3%~97.3% power reduction compared with LFSRs, while ensuring high fault coverage, less test patterns and low hardware overhead.