CYCLOGEN: automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation
A. Bechir, Bożena Kamińska · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 1995
In this paper we have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for single-output and multioutput electronic circuits. This measure computes the number of BDD paths to be transformed into test vectors. This new test generation approach, called CYCLOGEN, has been implemented, and the tests for several functional primitives, as well as the ISCAS-85 benchmark circuits, have been generated successfully. The results show that this approach is effective and promising.>