Temperature-Variation-Aware Test Pattern Optimization
Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Satô, Hideo Fujiwara · 2011
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.