A Unified View of Test Compression Methods
John P. Robinson, N.R. Saxena · IEEE Transactions on Computers · 1987
A unified treatment of the various techniques to reduce the output data from a unit under test is given. The characteristics of time compression schemes with respect to errors detected are developed. The use of two or more of these methods together is considered. Methods to design efficient test compression structures for built-in-tests are proposed. The feasibility of the proposed approach is demonstrated by simulation results.