Detection of bands in backscatter microscopy images using new Hough transform techniques
David P. Casasent, Linsen Chen, Ashit Talukder · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998
Electron backscatter patterns are used to analyze the crystallographic structure of materials and extract 3D grain orientation data that is of use in material science. We present new Hough transform pre- and post-processing algorithms to improve analysis of such data. Our new technique also reduces the computation time required.