Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
Savir · IEEE Transactions on Computers · 1980
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection.