Test Program Generation for Communication Peripherals in Processor-Based SoC Devices
Andreas Apostolakis, Dimitris Gizopoulos, Mihalis Psarakis, Danilo Ravotto, Matteo Sonza Reorda · IEEE Design & Test of Computers · 2009
Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.