A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youngjae Kim, Ki-Sun Kim, In‐Soo Kim, H. SON, S. KANG · IEICE Transactions on Information and Systems · 2008
This paper presents a new low power BIST TPG scheme for reducing scan transitions. It uses a transition freezing and melting method which is implemented of the transition freezing block and a MUX. When random test patterns are generated from an LFSR, transitions of those patterns satisfy pseudo-random Gaussian distribution. The proposed technique freezes transitions of patterns using a freezing value. Experimental results show that the proposed BIST TPG schemes can reduce average power reduction by about 60% without performance loss and peak power by about 30% in ISCAS'89 benchmark circuits.