A New Approach to Plane-Sweep Overlay: Topological Structuring and Line-Segment Classification
Jan W. van Roessel · Cartography and Geographic Information Systems · 1991
An integrated approach to spatial overlay was developed with the objective of creating a single function that can perform most of the tasks now assigned to discrete functions in current systems. Two important components of this system are a unique method for topological structuring, and a method for attribute propagation and line-segment classification.