A digital partial built-in self-test structure for a high performance automatic gain control circuit
Andreas Lechner, John F. Ferguson, Andrew Michael Richardson, B. Hermes · 1999
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques will be mandatory to meet test and quality specifications in next generation mixed signal integrated systems.This paper describes a new digital onchip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.