Discussion on stuck-at faults in combinational circuits
Hasan Cengiz Güran, Uğur Halıcı · International Journal of Electronics · 1989
In combinational logic circuits, stuck-at faults are permanent faults that are modelled as logical problems. In this study, a new method for finding the complete test set of single stuck-at faults is presented. A novel algorithm based on the given discussion is developed and applied to an example.