IP slant-incidence correction for accurate structure factor measurements
Kazunari Tanaka, T. Yoshimi, N. Morita · Acta Crystallographica Section A Foundations of Crystallography · 2005
TECHNIQUES C146align the detector so that one edge of the sensor lies very close to the beam.A special detector was manufactured by Rad-icon Imaging Corp to pass X-rays between two detector sensors, which were separated by about 3 mm.With this detector, it is possible to record a two-dimensional wide-angle diffraction pattern while another detector at the downstream end of the camera records a small-angle diffraction pattern.An active-pixel CMOS detector from Hamamatsu Photonics is also suitable for this purpose.