Design-for-testability of PLA's using statistical cooling
Ligthart, MM, Aarts, EHL Emile, Beenker, F P M · TU/e Research Portal · 1986
A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.