A Method of LFSR Seed Generation for Scan-Based BIST Using Constrained ATPG
Takanori Moriyasu, Satoshi Ohtake · 2013
This paper proposes a method of LFSR seed generation for scan-based BIST of VLSI circuits. The proposed method targets static faults and utilizes a commercial ATPG tool. Experimental results show that the proposed method can improve fault coverage and reduce the number of seeds compared with the conventional seed generation.