Robustness of digital approach to mismatch compensation in analog circuits realized in nanometer technologies
Zbigniew Jaworski, Piotr Wysokiński · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013
In this papers, a fully differential operational transconductance amplifier (OTA) implemented in 65 nm CMOS technology is analyzed to determine which component of the calibration circuitry is most susceptible to manufacturing process disturbances and thus impairs robustness of the calibration methodology. The average offset voltage of the OTA can be significantly reduced. It has been shown that effectiveness of the calibration methodology is limited by the offset voltage of the comparator that calculates sign of the OTA offset voltage.