Enabling efficient built-in-self-calibration for RFICs
Sleiman Bou‐Sleiman, Mohammed Ismail · 2011
Robustness and yield enhancement techniques for RF circuits and systems are gaining accelerating traction due to increased PVT variability in nanometer CMOS. One of the more viable approaches that make use of the increasingly heterogeneous systems is digitally-assisted RF, enabling circuit programmability and flexibility. With the inclusion of the more robust digital, RF circuits' impairments may be successfully overcome or significantly diminished. This is enabled by implementing self-calibration mechanisms on top of self-test routines. In this paper, we highlight the basic requirements for enabling the on-chip self-calibration loop and discuss the main design steps. We also show an LNA circuit example demonstrating self-healing capabilities.