Fault localisation when testing complex circuits
Raoul Velazco · IEE Proceedings G (Electronic Circuits and Systems) · 1985
An approach to state functional diagnoses when testing complex integrated circuits is presented. Such an approach can lead in some cases to low-level fault localisation. Experiments using the capabilities of a realised test system (GAPT test program generator, specific tester), illustrating the efficiency of this approach, are presented.