Economic effects in design and test
Ian Dear, C. Dislis, Anthony P. Ambler, Jochen Dick · IEEE Design & Test of Computers · 1991
The authors argue that because of misconceptions and myths about the cost of test, many devices and systems are inadequately tested. Focusing on application-specific integrated circuits (ASICs), the authors discuss the economics of test and show how economic analysis leads to test that pays back. The EVEREST test strategy planner, a design tool that aids in the selection of design-for-testability structures during ASIC design and uses cost as a primary selection parameter, is presented.>