Design of testability for analogue fault diagnosis
Chin‐Long Wey · International Journal of Circuit Theory and Applications · 1987
Abstract With the rapidly increasing complexity of circuits and systems, the ability adequately to design a diagnosable circuit or system is a prime requisite for rapid fault location. In the present paper, a necessary and sufficient condition for pseudo‐circuit generation is presented for the use of the pseudo‐circuit in the self‐test algorithm. to determine the diagnosability of a designed circuit, a testability condition is presented with examples. the unique feature of these conditions is that they depend only on the topological structure of a given circuit, not on the component values; therefore, these conditions can be implemented in both linear and non‐linear circuits or systems. With the aid of a computer, the test points may be generated automatically by the proposed algorithm. Based on the proposed algorithm, the design of testability can be established.