Cellular automata as a built in self test structure
Biplab Kumar Sikdar, Debesh Kumar Das, Vamsi Boppana, C. Yang, S. Mukherjee, P.P. Chaudhuri · 2001
This paper presents an efficient BIST solution for VLSI circuit testing based on GF(2p) CA (Cellular automata on an extended Galois Field). The novel architecture of GF(2p)) CA permits the BIST structure to be highly customized to the circuit under test (CUT). A methodology has been proposed to optimize the design of GF(2p) CA structure to maximize the fault coverage in a given CUT. In addition, an innovative scheme based on logic folding is presented to reduce the BIST overhead and make it more effective for large circuits.