Robust cryptographic ciphers with on-line statistical properties validation
Anna Vašková, C. López-Ongil, Alejandro Jiménez-Horas, Enrique San Millán, Luis Entrena · 2010
A new solution is presented for fast measuring of randomness properties of cryptographic algorithms. Statistical Tests from NIST are hardware implemented in order to enable an on-line detection of intentional attacks in cryptographic ciphers. The small area overhead and the short processing times provide a good solution for hardening this type of circuits.