Post-BIST Fault Diagnosis for Multiple Faults
H. TAKAHASHI, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Kazuyuki Yamazaki, Takashi Aikyo, Yasuo Satô · IEICE Transactions on Information and Systems · 2008
With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.